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Design For Testability (DFT) Consulting
IEEE 1149.1 (JTAG) eVC
The JTAG eVC is capable of verifying all compliant TAPs and scan chain architectures, with enhanced automation.
IEEE 1500 (SECT) eVC
Verify next generation test infrastructures of multiple embedded cores in an SoC environment.
IEEE 1500 eVC FAQ
Frequently Asked Questions on the IEEE 1500 eVC.