Papers by Globetech Solutions and Partners
Please select from these available resources
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This article describes the test wrapper implementation of a popular embedded microprocessor, along with an automated approach for verifying the wrapper's compliance to the standard.
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STIL Verifier: Post-Silicon Functional Test Automation within Cadence Incisive
[Download - application/pdf]
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Earlier this year, Globetech Solutions announced STIL
Verifier, the industry’s fastest route from functional verification to functional silicon test and debug. STIL Verifier aims at
extending verification capabilities into the post-silicon validation domain. Its goal is also to leverage verification environment constructs, process data, and
design knowledge to increase effectiveness and reduce cost during debug, validation, and volume test of semiconductor
devices.
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A Unified DFT Verification Methodology
[Download - application/pdf]
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This paper introduces a unified DFT Verification Methodology, aimed at providing a complete, methodical and fully automated path from test specification to DFT closure. We will also examine the benefits of this approach, looking at how this methodology can help bridge the widening gap between design and test.
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